The J.R. Simplot Co. has filed a patent for a method to determine crop yield. The method involves receiving yield data from multiple harvester machines and determining the primary harvester machine with the largest harvested area. It also determines adjacent harvested areas associated with other harvester machines and adjusts the yield measurement of the secondary harvester machine using the primary harvester machine’s measurements. The method generates calibrated yield data that can be used for harvest data analysis across multiple platforms. GlobalData’s report on J. R. Simplot gives a 360-degree view of the company including its patenting strategy. Buy the report here.

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According to GlobalData’s company profile on J. R. Simplot, RNAi pest resistance was a key innovation area identified from patents. J. R. Simplot's grant share as of September 2023 was 49%. Grant share is based on the ratio of number of grants to total number of patents.

Method for determining crop yield using harvester machine data

Source: United States Patent and Trademark Office (USPTO). Credit: The J. R. Simplot Co

A recently filed patent (Publication Number: US20230276734A1) describes a method for determining crop yield using yield data from multiple harvester machines. The method involves receiving yield data that includes measurements from different machines and determining the total harvested areas associated with each machine. The primary harvester machine, which has the largest total harvested area, is identified, and adjacent harvested areas are determined for the other machines. A secondary harvester machine is then determined based on the largest adjacent harvested area.

To ensure accurate yield measurements, the method adjusts the yield measurement associated with the secondary harvester machine using the yield measurements from the primary harvester machine. This adjustment process helps generate calibrated yield data that can be used for harvest data analysis across multiple platforms.

The patent also mentions additional steps that can be performed based on the calibrated yield data. These steps include constructing solid-set irrigation systems, planting cover crops, selecting fertilizer rates, and supporting subfield yield target driving nutrient or seed determinations. These actions can be taken in specific portions of a field based on the calibrated yield data.

The method described in the patent is applicable to situations where there are more than two harvester machines. In such cases, a primary harvester system is determined, consisting of the primary harvester machine and the secondary harvester machine. The process of determining adjacent harvested areas and adjusting yield measurements is repeated until all the yield measurements, except for the primary harvester machine, have been adjusted.

The patent also discusses various techniques for improving the accuracy of the yield measurements. These techniques include removing partial measurements that do not correspond to a full swath of a harvester machine, marking temporally contiguous instances of yield measurements, and removing polygons associated with speed or yield outliers. The method also involves determining the validity of polygons, calculating overlap between polygons, and removing overlapping polygons based on a threshold amount of area.

Overall, this patent presents a method for determining crop yield using yield data from multiple harvester machines. The method includes adjusting yield measurements, generating calibrated yield data, and performing various actions based on the calibrated yield data. The patent also describes techniques for improving the accuracy of the yield measurements.

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GlobalData, the leading provider of industry intelligence, provided the underlying data, research, and analysis used to produce this article.

GlobalData Patent Analytics tracks bibliographic data, legal events data, point in time patent ownerships, and backward and forward citations from global patenting offices. Textual analysis and official patent classifications are used to group patents into key thematic areas and link them to specific companies across the world’s largest industries.